The 26th IEEE Asian Test Symposium
(ATS’17)
Nov. 27-30, 2017
Palais de Chine Hotel, Taipei, Taiwan

http://ares.ee.ncu.edu.tw/ats17/

EXTENDED DEADLINE

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.

Original papers on, but not limited to, the following areas are invited:

• Analog/Mixed-Signal Test
• Automatic Test Generation
• Board Test and Diagnosis
• Boundary Scan Test
• Built-In Self-Test (BIST)
• Defect-Based Test
• Delay and Performance Test
• Dependability and Functional Safety
• Design for Test (DFT)
• Diagnosis and Silicon Debug
• Economic of Test
• Failure Analysis
• Fault Modeling and Simulation
• Fault Tolerance
• GPU Test
• High-Speed I/O Test
• Low-Power IC Test
• Memory Test and Repair
• MEMS Test
• Multi-/Many-core Processor Test
• Nanotechnology Test
• On-line Test
• Power/Thermal/Reliability Issues in Test • Reconfigurable System Test
• Reliability
• RF Test
• Hardware-oriented Security and Trust • Self-Repair
• Sensor Test
• SiP, Stacked, 3D IC Test
• Standards in Test
• Statistical Learning in Test
• Test Compression
• Test Quality
• Test Synthesis
• V alidation and V erification
• Yield Analysis and Enhancement

Submission website: https://easychair.org/conferences/?conf=ats20170

Regular Sessions: The ATS'17 Program Committee invites original, unpublished paper submissions on the above topics. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two- column format. The submission will be considered evidence that upon acceptance the author(s) will submit a final camera-ready version of the paper for inclusion in the proceedings, and will present the paper at the symposium. Each accepted contribution must have at least one full paid registration by the time the camera ready paper is submitted for inclusion in the proceedings. ATS reserves the right to remove from IEEE Xplore papers not presented at the symposium.

• Submission deadline: June 9, 2017 - extended
• Notification of acceptance: July 31, 2017 
• Camera ready manuscript: August 31, 2017

For paper submission information

Program Chair:

Jin-Fu Li
National Central Univ.
email: jfli@ee.ncu.edu.tw

General Chair

• Jiun-Lang Huang - National Taiwan Univ.

Program Chair

• Jin-Fu Li - National Central Univ.

Tutorial Chair

• Su-Min Li - National Sun Yat-Sen Univ.

Publicity Chair

• Shi-Yu Huang - National Tsing-Hua Univ.

Publication Chair

• Pi-Ho Hu - National Central Univ.

Finance Chair

• Chin-Ya Huang - National Central Univ.

Local Arrangement Chair

• Tong-Yu Hsieh - National Sun Yat-Sen Univ.

Registration Chair

• Shyue-Kung Lu - National Taiwan Univ. of Science and Tech.

Industry Chair

• Chun-Lung Hsu - Industrial Tech. Research Institute

North American Liaison

• Yiorgos Makris - The Univ. of Texas at Dallas

European Liaison

• Said Hamdioui - Delft Univ. of Tech.

The The 26th IEEE Asian Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).